Jandel Multi Height Four Point Probe
Jandel Multi Height Four Point Probe
TOOL ID: MET-08
- Allows probing of wafers, ingots, or samples of widely varying dimensions
- Locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height
- Plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc
- Smooth base for positioning samples
- Includes one Jandel Cylindrical probe head
Jandel Multi Height Four Point Probe
